Paper Title
STUDY OF ELECTRICAL PROPERTIES OF CDSE THIN FILMS USING CLOSED SPACE SUBLIMATION TECHNIQUE

Abstract
Abstract - Thermal vacuum evaporation method was used for the preparation of CdSe thin films having different thickness.For this preparationprecleaned amorphous glass substrate were used. The surface morphological properties of as prepared CdSe films have been characterized by various techniques, such as, X-ray diffraction (XRD), EDAX, field emission scanning electron microscopy (FESEM).FESEM investigation confirms that films were uniformly deposited over the surface and particles in irregular morphologies in the form of fibrous texture.TEP measurement confirms the deposited films are of P type semiconducting in nature.The electrical properties of the films have been evaluated such as resistivity (5.115 x 10-3 ohm-cm), carrier concentration (4.79 x 1012/cm3), mobility (2020.2cm2/Volt-Sec), activation energy (0.295 – 0.305 eV). XRD studies identify that the as-deposited CdSe films are highly oriented to [100] direction and they belong to nanocrystalline hexagonal phase. The lattice parameters (a = 4.292 and c = 7.012) and crystallite size (D) were calculated and found to be 156 nm. Keywords - XRD, FESEM, Four probe, TEP, Fermi energy.