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CONFERENCE DATE:
Bangalore, India 21-05-2023
 
Proceeding Detail

ACN INTERNATIONAL CONFERENCE

DEFECT DETECTION IN PRINTED CIRCUIT BOARDS USING DEEP LEARNING APPROACH
Page(s): 8-12  
Author SUMAIYA RASHID, BUSHRA MANZOOR, SUMIT BUDHIRAJA, GARIMA JOSHI, SARVJIT SINGH  
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WRL Cited By- 2

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